Analysis of the stress-optical effects in silica-on-silicon optical waveguides

摘要

Stress-induced birefringence in silica-on-silicon waveguides is analyzed by the finite element method using the normalized plane strain model. The simulation results show that the thermal expansion coefficient of the upper-cladding is the most critical factor. A waveguide with zero birefringence is obtained and used to realize polarization independent AWGs.