首页> 外文会议>Optical Engineering for Sensing and Nanotechnology (ICOSN '99) >Common-path multichannel heterodyne laser interferometer for subnanometer surface metrology
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Common-path multichannel heterodyne laser interferometer for subnanometer surface metrology

机译:用于亚纳米表面计量的共径多通道外差激光干涉仪

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Abstract: A multi-channel heterodyne laser interferometer is proposed for measurement of optical surface deformations at the sub- nanometer level. This interferometer employs a common-path configuration and heterodyne detection, by which fringe errors due to laser frequency fluctuations and optical path variations due to vibration can be reduced. By measuring the heterodyne signal phase among sub-apertures (pixels) with a 2- D detector array, the surface height can be reconstructed and surface deformation can be measured by comparing consecutive measurements. Detection of sub-nanometer level surface deformation is achieved using high precision digital phase meters and athermalized opto-mechanical systems. This paper describes the interferometer design criteria and experiment methodologies. !10
机译:摘要:提出了一种多通道外差激光干涉仪,用于测量亚纳米级的光学表面变形。该干涉仪采用共通路径配置和外差检测,可以减少由于激光频率波动和振动引起的光路变化引起的条纹误差。通过使用二维探测器阵列测量子孔径(像素)之间的外差信号相位,可以重建表面高度,并可以通过比较连续的测量结果来测量表面变形。亚微米级表面变形的检测是通过使用高精度数字相位计和无热光机械系统实现的。本文介绍了干涉仪的设计标准和实验方法。 !10

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