首页> 外文会议>Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997 >Identification of electron-hole transitions in short-period GaAs/AlAs superlattices by time-resolved photoluminescence
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Identification of electron-hole transitions in short-period GaAs/AlAs superlattices by time-resolved photoluminescence

机译:通过时间分辨光致发光识别短周期GaAs / AlAs超晶格中的电子-空穴跃迁

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摘要

Abstract: Temporal characteristics of the carriers recombination were investigated in different types of GaAs/AlAs superlattices by the time-resolved photoluminescence spectroscopy. The peculiarities of the electron-hole transitions were established for the superlattices studied in the dependence of the superlattice type and the width of quantum well and barrier layers. In particular, the conditions of existence of free and localized on the interface roughness excitons were found.!11
机译:摘要:通过时间分辨光致发光光谱研究了不同类型的GaAs / AlAs超晶格中载流子复合的时间特性。根据超晶格类型与量子阱和势垒层宽度的关系,为研究的超晶格确定了电子-空穴跃迁的特性。特别是,发现了存在于界面粗糙度激子上的自由和局部存在的条件!! 11

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