Optical properties of thin Al films studied by ordinary and polariton spectroellipsometry

摘要

Abstract: The new technique of measurements of the ellipsometric parameters and the optical constants of the thin metallic films with excitation of surface polaritons by Kretschman method is elaborated. It is shown that unlike the some authors' opinion both the excitation of the polaritons on the opposite to the illuminated side and the detection of the polaritons are possible for the film with thickness less than 30 nm.!6