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Formation and Plasmonic Properties of silicon nanowire arrays producedby chemical etching

机译:化学刻蚀产生的硅纳米线阵列的形成及其等离子特性

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We have investigated the formation of silicon nanowire arrays by the use of a simple chemical etching approach. The etching characteristics of silicon nanowire arrays using wafers with diverse doping levels and several orientations have been examined. Furthermore, the etching solution, etching time and temperature were also considered in order to optimize the etching conditions to produce thinner and more orderly silicon nanowire arrays in registry with the substrate. Since this process takes advantage of a silver catalyst, we have also investigated various ways of forming the initial silver catalyst on the silicon surfaces, and we show that electroless Ag deposition, as well as e-beam thin film deposition of Ag, results in successful, highly aligned and ordered Si nanowire arrays after the etching step. In addition, we have also performed Surfaced Enhanced Raman Scattering (SERS) measurements on the nanowire arrays and on nanowires removed from the substrate.
机译:我们已经通过使用简单的化学蚀刻方法研究了硅纳米线阵列的形成。已经研究了使用具有不同掺杂水平和几种取向的晶片的硅纳米线阵列的蚀刻特性。此外,还考虑了蚀刻溶液,蚀刻时间和温度,以优化蚀刻条件,以产生更薄,更有序的与基板对准的硅纳米线阵列。由于此工艺利用了银催化剂,因此,我们还研究了在硅表面上形成初始银催化剂的各种方法,并且我们证明了无电Ag沉积以及Ag的电子束薄膜沉积都能成功实现在蚀刻步骤后,高度对准且有序的Si纳米线阵列。此外,我们还对纳米线阵列和从基板上移除的纳米线进行了表面增强拉曼散射(SERS)测量。

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