Dynamic Force Microscopy and X-ray Photoemission Spectroscopy Studies of Conducting Polymer Thin Film on Nanoscale Structured Al Surface

摘要

A nanoscale linked-crater structure was fabricated on an Al surface by chemical and electrochemical combination processes. The surface of an Al plate was treated with Semi Clean and was successively processed in anodization in H_2SO_4. Dynamic force microscopy image (DFM) showed that a linked-crater structure was formed on the Al surface. At the next stage, the authors conducted the thin film growth of conducting polymer polythiophene on the Al surface by an electrochemical method. The electrochemical polymerization on the Al surface was performed in acetonitrile containing thiophene monomer and (Et)_4NBF_4 as a supporting electrolyte. After being electrochemically processed, the contour image of each crater was still recognized implying that the polymer nanofilm was grown on the nanoscale structured Al surface. The cross section analysis demonstrated that the nanofilm was grown along the linked-crater structure because the contour of each crater became thick. X-ray photoemission spectroscopy measurement also supported the polymer nanofilm growth because C 1s and S 2p lines were detected. Furthermore, copper phthalocyanine (CuPc) molecules are injected into the polymer nanofilm grown on the nanoscale structured Al surface by diffusing method in order to functionalize the nanoscale hybrid material.