首页> 外文会议>Multilayer and Grazing Incidence X-Ray/EUV Optics >X-ray scattering measurements from thin-foil x-ray mirrors
【24h】

X-ray scattering measurements from thin-foil x-ray mirrors

机译:薄箔X射线镜的X射线散射测量

获取原文
获取原文并翻译 | 示例

摘要

Abstract: Thin foil x-ray mirrors are used as the reflecting elements in the telescopes of the x-ray satellites SPECTRUM-X-GAMMA (SRG) and ASTRO-D. High-resolution x-ray scattering measurements from the Au-coated and dip-lacquered Al foils are presented. These were obtained from SRG mirrors positioned in a test quadrant of the telescope structure and from ASTRO-D foils held in a simple fixture. The x-ray data is compared with laser data and other surface structure data such as scanning tunneling microscopy (STM), atomic force microscopy (AFM), transmission electron microscopy (TEM), and electron micrography. The data obtained at Cu K$alpha$-1$/, (8.05 keV) from all the mirrors produced on Al foils shows a scatter that limits the obtainable half power width (HPW) to $GREQ 1.5 arc min. Mirrors based on electroformed Ni foils, however, show local regions with a factor of 4 better performance and they are being developed for future applications. !11
机译:摘要:薄箔X射线镜被用作X射线卫星SPECTRUM-X-GAMMA(SRG)和ASTRO-D望远镜的反射元件。提出了从镀金和浸涂铝箔的高分辨率x射线散射测量结果。这些是从位于望远镜结构测试象限中的SRG反射镜和从固定在简单夹具中的ASTRO-D箔片获得的。将X射线数据与激光数据和其他表面结构数据进行比较,例如扫描隧道显微镜(STM),原子力显微镜(AFM),透射电子显微镜(TEM)和电子显微镜。从铝箔上生产的所有反射镜以CuKα-1,(8.05 keV)获得的数据显示,散射将可得到的半功率宽度(HPW)限制为$ GREQ 1.5 arc min。但是,基于电铸镍箔的反射镜显示出的局部区域性能提高了4倍,并且正在为将来的应用而开发。 !11

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号