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Design and analysis of ultra wideband GaN dual-gate HEMT low noise amplifiers

机译:超宽带GaN双栅极HEMT低噪声放大器的设计与分析

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This paper presents two ultra wide bandwidth low noise amplifiers utilizing 0.18-um AlGaN/GaN HEMT technology. The single-stage, resistive feedback microstrip amplifiers target two different frequency bands, 0.3 - 4 GHz and 1.2 - 18 GHz, capable of better than 13:1 bandwidth. Both amplifiers use dual-gate HEMT devices with an on-chip drain bias network. The low frequency amplifier achieves 17.7 dB flat gain between 300 MHz - 3 GHz, and 1.2 dB minimum noise figure around 1.3 GHz. The high frequency LNA shows an average of 13 dB gain and between 2 to 3 dB noise figure across the band. The robust LNAs can be operated under various bias voltages while similar gain and noise figure performance are maintained.
机译:本文介绍了两个采用0.18um AlGaN / GaN HEMT技术的超宽带低噪声放大器。单级电阻反馈微带放大器的目标是两个不同的频带,分别为0.3-4 GHz和1.2-18 GHz,其带宽优于13:1。两种放大器均使用具有片上漏极偏置网络的双栅极HEMT器件。低频放大器在300 MHz-3 GHz之间实现了17.7 dB的平坦增益,在1.3 GHz附近实现了1.2 dB的最小噪声系数。高频LNA的平均增益为13 dB,整个频带的噪声系数在2至3 dB之间。坚固的LNA可以在各种偏置电压下工作,同时保持相似的增益和噪声系数性能。

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