首页> 外文会议>Microwave Photonics, 1996. MWP '96. Technical Digest >Analysis of potential high power failure in millimetric Schottkybarrier diodes
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Analysis of potential high power failure in millimetric Schottkybarrier diodes

机译:毫米肖特基势垒二极管的潜在大功率故障分析

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An experimental and theoretical study has been made of thencharacteristics, performance, and limitations of a Schottky barrierndiode operating as a power sampler at 35 GHz. The Schottky diode is usednto rectify incident power at 35 GHz, the resulting DC current is used tonpre-bias a waveguide mounted PIN diode into a low impedance, highnattenuation state. The diode junction is frequently subjected toncomparatively high levels of incident RF power and for a variety ofnreasons it is important to know how the diode responds in thisnenvironment. For instance, the designer needs to know what is thenmaximum, worst case, safe power level that the device can withstand.nEqually, it is important to know whether the diode, together with itsnassociated microwave circuitry, will respond quickly enough at the onsetnof incident power, which factors will affect conversion efficiency, andnlikely performance at higher frequencies, notably 60 GHz and 94nGHz
机译:已经进行了实验和理论研究,研究了在35 GHz频率下作为功率采样器的肖特基势垒二极管的特性,性能和局限性。肖特基二极管用于对35 GHz的入射功率进行整流,所产生的DC电流用于将安装在波导中的PIN二极管偏置到低阻抗,高衰减状态。二极管结通常要承受较高水平的入射RF功率,并且由于各种原因,重要的是要了解二极管在这种环境中的响应方式。例如,设计人员需要知道该设备可以承受的最大,最坏情况,安全功率水平。n同样,重要的是要知道二极管及其相关的微波电路在入射功率启动时是否能够足够迅速地做出响应。 ,哪些因素会影响转换效率,并可能影响较高频率(尤其是60 GHz和94nGHz)下的性能

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