Crystallite Thickness Estimates from Precession Electron Diffraction Patterns for Structural Fingerprinting in the Quasi-kinematic Limit

机译：准运动极限中结构指纹的进动电子衍射图案的晶体厚度估计。

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来源
《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》|2012年|562-563|共2页
会议地点 Phoenix, AZ(US)
作者
P. Moeck; J. C. Straton; S. Rouvimov; I. Haeusler;
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Department of Physics Portland State University Portland OR 97207-0751;

Institute of Physics Humboldt University of Berlin NewtonstraPe 15 12489 Berlin Germany;

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入库时间 2022-08-26 14:38:38

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Crystallite Thickness Estimates from Precession Electron Diffraction Patterns for Structural Fingerprinting in the Quasi-kinematic Limit

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