Dislocation Analysis in Metal-Oxide Materials and Devices by Electron Channeling Contrast Imaging

著录项

• 来源
  《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》|2012年|706-707|共2页
• 会议地点 Phoenix, AZ(US)
• 作者

  Ranga J. Kamaladasa; Mohammad Norman; Yimeng Lu; James A. Bain; Paul A. Salvador; Marc De Graef; Marek Skowronski; Yoosuf N. Picard;

  展开▼
• 作者单位

  Materials Science and Engineering Carnegie Mellon University Pittsburgh PA;

  Electrical & Computer Engineering Department Carnegie Mellon University Pittsburgh PA;

  展开▼
• 会议组织
• 原文格式 PDF
• 正文语种
• 中图分类
• 关键词

• 入库时间 2022-08-26 14:38:37