首页> 外文会议>Microscopy and microanalysis.;Microscopy and microanalysis. >Optical, Structural and Interface Characterization of Single SiO2-SiC Core-Shell Nanowires Grown with a Low Cost Method
【24h】

Optical, Structural and Interface Characterization of Single SiO2-SiC Core-Shell Nanowires Grown with a Low Cost Method

机译:用低成本方法生长的单根SiO2-SiC核壳纳米线的光学,结构和界面表征

获取原文
获取原文并翻译 | 示例

著录项

  • 来源
  • 会议地点 Portland OR(US)
  • 作者单位

    IMEM-CNR Institute, viale Usberti 37/A, 43124 Parma Italy;

    IMEM-CNR Institute, viale Usberti 37/A, 43124 Parma Italy;

    IMEM-CNR Institute, viale Usberti 37/A, 43124 Parma Italy;

    IMEM-CNR Institute, viale Usberti 37/A, 43124 Parma Italy;

    IMEM-CNR Institute, viale Usberti 37/A, 43124 Parma Italy;

    IFN-CNR Institute, Via alla Cascata 56/C – Povo, 38123 Trento Italy;

    IFN-CNR Institute, Via alla Cascata 56/C – Povo, 38123 Trento Italy;

    IFN-CNR Institute, Via alla Cascata 56/C – Povo, 38123 Trento Italy;

    International Center for Materials Nanoarchitectonics, National Institute for Materials Science PRESTO JST, 1-1 Namiki, Tsukuba, Ibaraki, 305-0044 Japan;

    Nano device characterization group, Advanced Electronic Materials Center, National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki, 305-0044 Japan;

    Nano device characterization group, Advanced Electronic Materials Center, National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki, 305-0044 Japan;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 显微镜;
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号