In situ Electron Microscopy Characterization of OptoelectronicNanostructures and Nanodevices

著录项

• 来源
  《Microscopy and microanalysis.;Microscopy and microanalysis. 》|2010年|p.1758-1759|共2页
• 会议地点 Portland OR(US)
• 作者

  Min Gao; Chengyao Li; Wenliang Li; Zhao Liu; Lian-Mao Peng;

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• 作者单位

  Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University, Beijing 100871, People's Republic of China;

  Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University, Beijing 100871, People's Republic of China;

  Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University, Beijing 100871, People's Republic of China;

  Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University, Beijing 100871, People's Republic of China;

  Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University, Beijing 100871, People's Republic of China;

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• 会议组织
• 原文格式 PDF
• 正文语种 eng
• 中图分类 显微镜 ;
• 关键词