Strain Relaxation by Misfit Dislocations in Nanoscale Epitaxial Ferroelectric BaTiO3 Films Grown on SrTiO3 Substrate

著录项

• 来源
  《Microscopy Society of America annual meeting;Microscopy Society of Canada annual meeting;Societe de Microscopie du Canada annual meeting;Microbeam Analysis Society annual meeting;International Metallographic Society annual meeting》|2002年|1-2|共2页
• 会议地点 Quebec City(CA);Quebec City(CA);Quebec City(CA);Quebec City(CA);Quebec City(CA)
• 作者

  H. P. Sun; W. Tian; J. H. Haeni; D. G. Schlom; X. Q. Pan;

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• 作者单位

  Dept. of Materials Science and Engineering, University of Michigan, Ann Arbor, MI 48109;

  Dept. of Materials Science and Engineering, University of Michigan, Ann Arbor, MI 48109;

  Dept. of Materials Science and Engineering, Penn. State University, University Park, PA 16802;

  Dept. of Materials Science and Engineering, Penn. State University, University Park, PA 16802;

  Dept. of Materials Science and Engineering, University of Michigan, Ann Arbor, MI 48109;

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• 会议组织
• 原文格式 PDF
• 正文语种 eng
• 中图分类 观察、分析晶体结构的实验方法;
• 关键词