Convolutional Neural Network for Imbalanced Data Classification of Silicon Wafer Defects

著录项

• 来源
  《International Colloquium on Signal Processing Its Applications》|2020年|230-235|共6页
• 会议地点 Langkawi(MY)
• 作者

  Uzma Batool; Mohd Ibrahim Shapiai; Hilman Fauzi; Jia Xian Fong;

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• 作者单位

  University of Wah Department of Computer Science Wah Cantt Pakistan;

  Centre for Artificial Intelligence and Robotics iKohza Malaysia-Japan International Institute of Technology Universiti Teknologi Malaysia Kuala Lumpur Malaysia;

  Faculty of Electrical Engineering Telkom University Bandung Indonesia;

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• 会议组织
• 原文格式 PDF
• 正文语种
• 中图分类
• 关键词

  Feature extraction; Silicon; Machine learning; Semiconductor device modeling; Training; Convolution; Pattern recognition;

  机译：特征提取;硅;机器学习;半导体器件建模;训练;卷积;模式识别;