A Development of Adolescent Depression Screening Using Naive Bayes Classifier Algorithm

著录项

• 来源
  《International conference on computer science and it applications;KIPS international conference on ubiquitous information technologies 》|2018年|512-518|共7页
• 会议地点 Kuala Lumpur(MY)
• 作者

  Samuel Garbo; Ha-Yeong Kim; Syntia Widyayuningtias Putri; Ermal Elbasani; Hye-Sun Ahn; Jeong-Dong Kim;

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• 作者单位

  School of Computer Science and Engineering Sun Moon University Asan-si Chungchengnam-do 31460 Korea;

  Graduate School IT Policy and Management Soongsil University Sangdo-Ro Dongjak-Gu Seoul 06978 Korea;

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• 会议组织
• 原文格式 PDF
• 正文语种
• 中图分类
• 关键词

  Depression; Adolescent depression screening; Naive Bayes algorithm; Beck depression inventor;

  机译：萧条;青少年抑郁症筛查;朴素贝叶斯算法;贝克抑郁症的发明者;