Challenges in Low Cost Test Approach for ARM9 Core Based Mixed-Signal SoC DragonBall-MX1

摘要

This paper discussed the challenges that we faced when we developed the low cost test strategies for the new generation ARM9 Core based mixed-signal System-on-a-Chip (SoC), DragonBall-MX1 (DBMX1). First of all, we presented a tailored cost model to select our Automatic Test Equipment (ATE). With this low cost tester, we developed a method for at-speed digital tests with slower tester clock, a new embedded PLL jitter test approach with sliding delta cycle and fixed strobe, and a loop-back self-test proposal for embedded ADC and DAC. Our final target is to achieve all the mixed-signal tests on a very low cost pure digital ATE.