首页> 外文会议>Conference on infrared technology and applications >IR CMOS: ultrafast laser-enhanced silicon detection
【24h】

IR CMOS: ultrafast laser-enhanced silicon detection

机译:IR CMOS:超快激光增强硅检测

获取原文
获取外文期刊封面目录资料

摘要

SiOnyx has developed a novel silicon processing technology for CMOS sensors that will extend spectral sensitivity into the near/shortwave infrared (NIR/SWIR) and enable a full performance digital night vision capability comparable to that of current image-intensifier based night vision goggles. The process is compatible with established CMOS manufacturing infrastructure and has the promise of much lower cost than competing approaches. The measured thin layer quantum efficiency is as much as 10x that of incumbent imaging sensors with spectral sensitivity from 400 to 1200 nm.
机译:Sionyx为CMOS传感器开发了一种新型硅处理技术,可以将光谱敏感性延长到近/短波红外(NIR / SWIR)中,并实现完整的性能数字夜视能力,与当前的图像增强型夜视护目镜相当。该过程与建立的CMOS制造基础设施兼容,承诺比竞争方法要低得多。测量的薄层量子效率高达现有的成像传感器的10倍,具有400至1200nm的光谱灵敏度。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号