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Theoretical Study of Electrical Contact Dustiness Impact on Transition Resistance

机译:电接触尘性对转变抗性的理论研究

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Electronic equipment widely uses low-voltage electrical contacts. Errors and failures in such contacts basically occur due to dust contact surfaces, the formation of films, changes in the pressing force of the contacts, etc. The development of mathematical models of the electrical contacts allow us to determine the main parameters of the switching elements taking into account possible contamination and to develop methods of prevention of failures. This article discusses the mathematical model used to determine the resistance of the transition zone of the electrical contacts. The proposed model takes into account elastic, elastoplastic and plastic deformation of Microsystem rough surface contacts, the presence of surface films and dust particles on them. The obtained theoretical dependence of the probability of failure of the electrical contacts on the concentration of dust particles. The failure of probation was fixed at an increase of the transition resistance of the transition zone twice.
机译:电子设备广泛使用低压电触点。由于灰尘接触表面,膜的形成,触点的压力变化等,这种触点中的误差和故障基本上发生。电触点的数学模型的发展允许我们确定开关元件的主要参数考虑到可能的污染,并制定防止失败的方法。本文讨论了用于确定电触点的过渡区的电阻的数学模型。所提出的模型考虑了微系统粗糙表面触点的弹性,弹塑性和塑性变形,在它们上存在表面膜和灰尘颗粒。获得了电触点失效概率对粉尘颗粒浓度的理论依赖性。试用剂的失败在过渡区的过渡电阻的增加两次。

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