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Theoretical Study of Electrical Contact Dustiness Impact on Transition Resistance

机译:电接触粉尘对过渡电阻影响的理论研究

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Electronic equipment widely uses low-voltage electrical contacts. Errors and failures in such contacts basically occur due to dust contact surfaces, the formation of films, changes in the pressing force of the contacts, etc. The development of mathematical models of the electrical contacts allow us to determine the main parameters of the switching elements taking into account possible contamination and to develop methods of prevention of failures. This article discusses the mathematical model used to determine the resistance of the transition zone of the electrical contacts. The proposed model takes into account elastic, elastoplastic and plastic deformation of Microsystem rough surface contacts, the presence of surface films and dust particles on them. The obtained theoretical dependence of the probability of failure of the electrical contacts on the concentration of dust particles. The failure of probation was fixed at an increase of the transition resistance of the transition zone twice.
机译:电子设备广泛使用低压电触点。这种触点的错误和故障基本上是由于灰尘接触表面,薄膜的形成,触点的按压力的变化等引起的。电触点数学模型的发展使我们能够确定开关元件的主要参数考虑到可能的污染并制定预防故障的方法。本文讨论了用于确定电触点过渡区电阻的数学模型。所提出的模型考虑了Microsystem粗糙表面接触的弹性,弹塑性和塑性变形,表面膜和灰尘颗粒的存在。所获得的电触头失效概率对粉尘颗粒浓度的理论依赖性。试用期失败被固定为过渡区的过渡阻力增加了两倍。

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