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The Isophotic Metric and Its Application to Feature Sensitive Morphology on Surfaces

机译:异步指标及其在表面敏感形态的应用

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We introduce the isophotic metric, a new metric on surfaces, in which the length of a surface curve is not just dependent on the curve itself, but also on the variation of the surface normals along it. A weak variation of the normals brings the isophotic length of a curve close to its Euclidean length, whereas a strong normal variation increases the isophotic length. We actually have a whole family of metrics, with a parameter that controls the amount by which the normals influence the metric. We are interested here in surfaces with features such as smoothed edges, which are characterized by a significant deviation of the two principal curvatures. The isophotic metric is sensitive to those features: paths along features are close to geodesics in the isophotic metric, paths across features have high isophotic length. This shape effect makes the isophotic metric useful for a number of applications. We address feature sensitive image processing with mathematical morphology on surfaces, feature sensitive geometric design on surfaces, and feature sensitive local neighborhood definition and region growing as an aid in the segmentation process for reverse engineering of geometric objects.
机译:我们介绍了异步度量,表面上的新度量,其中表面曲线的长度不仅仅是依赖于曲线本身,而且还依赖于曲线本身,而且还依赖于曲线上的曲线。通常的弱变化使得曲线的异常性长度接近其欧几里德长度,而强烈的正常变化会增加异味长度。我们实际上拥有一系列的指标,一个参数控制正常影响度量的数量。我们对具有平滑边缘等特征的表面感兴趣,其特征在于两个主曲率的显着偏差。异步指标对这些特征敏感:沿着异常度量的路径靠近大测地测,跨特征的路径具有高的异步长度。这种形状效果使得对许多应用有用的异步度量。我们地址具有在表面上的数学形态的特征敏感图像处理,特征敏感的几何设计,以及特征敏感的本地邻域定义和区域,作为几何物体逆向工程的分割过程中的辅助。

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