Prediction of a thickness of a paint film by applying a PLS1 method to data obtained in terahertz reflectometry

摘要

We have applied a modified partial-least-squares-1 (PLS1) method to time-domain (TD) data obtained in terahertz (THz) reflectometry for predicting the thickness of a paint film on a substrate. The proposed procedure can be carried out effectively for a moderately-thin film rather than a thick one.