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HBM tester parasitic effects on high pin count devices with multiple power and ground pins

机译:HBM测试仪对具有多个电源和接地引脚的高针计数设备寄生效应

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A new Human Body Model (HBM) SPICE equivalent lumped element model (LEM) circuit that reproduces parasitic resistance, capacitance and inductance (RLC) tester effects has been used to investigate how the HBM current flows through several different relay-matrix HBM simulators. SPICE analysis shows that unwanted interaction between the simulators RLC parasitics and the IC component could be significantly reduced, if all of the HBM current flowed through the primary ground path and not through parasitic current paths unintentionally built inside the HBM simulators.
机译:用于再现寄生电阻,电容和电感(RLC)测试效果的新的人体模型(HBM)Spice等效集总数模型(LEM)电路用于研究HBM电流如何通过几种不同的中继矩阵HBM模拟器流动。 Spice分析表明,如果所有HBM电流流过一次接地路径而不是通过HBM模拟器内部无意地构建的所有HBM电流,则可以显着降低模拟器RLC寄生菌和IC部件之间的不希望的相互作用。

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