Phase Sensitive Computer Tomographic Measurement Using a Pixelated Phase Mask Interferometry Technique

摘要

A computed tomographic measurement based on sensing the introduced phase changes of a transparent sample is implemented. The interferometry system is composed by a polarizing Michelson interferometer coupled to a pixelated polarization camera in order to acquire the real-time phase information by polarization phase shifting techniques instantaneously. By obtaining measurements at different angles of rotation, added with computed tomographic algorithms, inner information of a sample was obtained. Characteristics of the implemented system are explained and experimental results showing inner distribution phase changes of a high temperature torch, at steady laminar flow conditions, are presented.