New X-ray parallel beam facility XPBF 2.0 for the characterization of silicon pore optics

摘要

A new X-ray parallel beam facility (XPBF 2.0) has been installed in the laboratory of the Physikalisch-Technische Bundesanstalt at the synchrotron radiation facility BESSY II in Berlin to characterize silicon pore optics (SPOs) for the future X-ray observatory ATHENA. As the existing XPBF which is operated since 2005, the new beamline provides a pencil beam of very low divergence, a vacuum chamber with a hexapod system for accurate positioning of the SPO to be investigated, and a vertically movable CCD-based camera system to register the direct and the reflected beam. In contrast to the existing beamline, a multilayer-coated toroidal mirror is used for beam monochromatization at 1.6 keV and collimation, enabling the use of beam sizes between about 100 μm and at least 5 mm. Thus the quality of individual pores as well as the focusing properties of large groups of pores can be investigated. The new beamline also features increased travel ranges for the hexapod to cope with larger SPOs and a sample to detector distance of 12 m corresponding to the envisaged focal length of ATHENA.