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Nanogroove Formation By Ag-Assisted Chemical Etching to Separate Neighboring Terraces on Vicinal Si(111)

机译:Ag辅助化学蚀刻的纳米GROOVE形成,以将相邻露台分开在vicinal si(111)上

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We aim to form nanogrooves to separate neighboring terraces on a Si surface for the fabrication of functional devices such as nanogap electrodes. For this purpose, we propose a self-assembled process composed of multiple wet-chemical treatments of a vicinal Si(111) surface. In this scheme, we used p-type Si(111) wafers with resistivity 10-20 Ω cm. The miscut angle was 0.2°. After both metallic and organic contaminants were removed from the Si wafer by wet cleaning, it was dipped into a dilute HF solution to passivate the surface with H atoms. The sample was then immersed for 25 minutes in water with an ultralow level of dissolved oxygen, which is referred to hereafter as LOW. LOW was obtained by adding the deoxygenation agent ammonium sulfite monohydrate to deionized water in which the O_2 concentration was less than 3 ppb. This treatment with LOW led to anisotropic etching of Si(111) to form atomically flat terraces together with atomic steps. Each terrace width was approximately 90 nm. Next, the flattened Si sample was immersed for 2-5 seconds in LOW containing Ag~+ ions at a concentration of 5 ppm. Atomic force microscopy (AFM) observations revealed that Ag atoms were selectively adsorbed at the edges of atomic steps on Si(111). In other words, Ag nanowires were formed along the step edges. Nanowire width and height were approximately 10 and 3 nm, respectively. Based on previous reports, it is speculated that the immersion of a flattened Si(111) surface into LOW caused the decoration of the step edge with hydroxyl (OH) species. The oxygen atom in OH strongly interacted with Ag~+ ions, promoting the transfer of electrons from the Si substrate to the ions. As a result, reduced Ag atoms were adsorbed at the step edges, and a Si dioxide (SiO_2) film was formed locally underneath the Ag nanowires. Finally, the Si sample with Ag nanowires was immersed into a mixture of HF, H_2O_2, and deionized water for a few minutes. The HF and H_2O_2 concentrations were 4.6 and 0.005 M, respectively. AFM images indicated that adsorbed Ag atoms at step edges were replaced by perforated grooves. Groove width and depth were about 10 and 2 nm, respectively. The Ag nanowires are interpreted as acting as a catalyst to enhance chemical etching of the Si surface underneath, thus forming the nanogrooves. It is supposed that the Ag atoms dissolved gradually during the immersion into the solution containing H_2O_2. Finally, a likely explanation for formation of a "perforated" groove, rather than a continuous one, is that Ag atoms did not align to form a continuous wire during the deposition process; this finding indicates that the deposition process needs improvement. Nevertheless, these results present a possibility in which nanogrooves can be formed along a step edge on a Si(111) surface by catalyst-assisted chemical etching using a template of Ag nanowires. Because this process enables the separation of neighboring Si terraces, it is expected to be of use for future Si-based nanodevices.
机译:我们的目标是形成纳米腔,以在Si表面上分离相邻梯田,以制造纳米隙电极的功能装置。为此目的,我们提出了一种由邻近Si(111)表面的多种湿化学处理组成的自组装过程。在该方案中,我们使用具有电阻率的P型Si(111)晶片10-20Ωcm。剪切角度为0.2°。通过湿式清洁从Si晶片中除去金属和有机污染物后,将其浸入稀释的HF溶液中以将表面与H原子钝化。然后将样品浸入水中,在水中浸入水中25分钟,溶解氧的超低水平,下文称为低。通过将脱氧剂亚硫酸铵一水合物加入去离子水中而获得低,其中O_2浓度小于3 ppb。这种用低导致Si(111)的各向异性蚀刻的处理,以与原子步骤一起形成原子平坦的露台。每个露台宽度约为90 nm。接下来,将扁平的Si样品浸入低含有5ppm的Ag〜+离子的低含量2-5秒。原子力显微镜(AFM)观察显示,在Si(111)上的原子步骤边缘中选择性地吸附着Ag原子。换句话说,沿着台阶边缘形成Ag纳米线。纳米线宽度和高度分别为约10和3nm。基于先前的报道,推测扁平的Si(111)表面浸入低导致步进边缘与羟基(OH)物种的装饰。 OH中的氧原子与Ag〜+离子强烈相互作用,促进电子从Si底物转移到离子。结果,在步进边缘中吸附了减少的Ag原子,并且在Ag纳米线下局部地形成Si二氧化硅(SiO_2)膜。最后,将具有Ag纳米线的Si样品浸入HF,H_2O_2和去离子水的混合物中几分钟。 HF和H_2O_2浓度分别为4.6和0.005米。 AFM图像表明,步进边缘的吸附Ag原子被穿孔槽代替。凹槽宽度和深度分别为约10和2nm。 Ag纳米线被解释为作用作为催化剂,以增强下面的Si表面的化学蚀刻,从而形成纳米藻叶。假设Ag原子在浸入含有H_2O_2的溶液中逐渐溶解。最后,对形成“穿孔”凹槽而不是连续的可能的解释是,在沉积过程中,Ag原子在形成连续线上;此发现表明沉积过程需要改进。然而,这些结果存在于通过使用Ag纳米线的模板通过催化剂辅助化学蚀刻沿Si(111)表面上的步进边缘形成纳米Roves的可能性。由于此过程能够分离相邻的SI梯田,因此预计将为未来的基于SI的NANODEXICES使用。

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