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SiGe Nanoring Formation

机译:Sig E nano ring formation

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摘要

Based on atomic force microscopy, high-angle annular dark-field scanning transmission electron microscopy, energy dispersive x-ray spectroscopy, and Raman spectroscopy, Ge outdiffusion effects on SiGe quantum dots to form nanorings are studied using the Ultra-High Vacuum Chemical Vapor Deposition. The epitaxial Si layer grown on quantum dots with SiH4 and H2 precursors can not cover the whole quantum dots, and the central area is passivated by the hydrogen. After annealing longer than 1 hour at 500oC in vacuum, the Ge atoms at the central area of quantum dots diffuse outward to form nanorings. However, the epitaxial Si layer grown with SiH4 and He precursors can cap all over the quantum dots, and the Si cap layer retards the Ge outdiffusion at the central area of quantum dots, resulting in 4 hour annealing time. Moreover, for the uncapped quantum dots, the annealing in H2 also prevents the Ge outdiffusion at the central area and no nanorings are observed up to 5 hour annealing at 500oC.
机译:基于原子力显微镜,高角度环形暗场扫描透射电子显微镜,能量分散X射线光谱和拉曼光谱,采用超高真空化学气相沉积研究了对SiGe量子点的Ge uckerfiffus效应形成纳米件。在具有SiH4和H 2前体的量子点上生长的外延Si层不能覆盖整个量子点,并且中心区域被氢气钝化。在真空中在500 oc的500℃下进行超过1小时的退火后,量子点的中心区域的GE原子弥漫在向外形成纳米。然而,用SiH4和He前体生长的外延Si层可以覆盖全量子点,并且Si盖层在量子点的中心区域延迟了GE umeryfiffus,导致4小时退火时间。此外,对于未映比的量子点,H2中的退火还防止了中心区域的GE ucketiffus,并且在500℃下没有观察到5小时的退火。

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