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Influence of niobium dopant on the photoelectrochemical performance and photochargeability of SrTiO3 films

机译:铌掺杂剂对SRTIO3薄膜光电化学性能和光可力性的影响

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SrTi1-xNbxO3 films with thickness of about 200 nm on nickel substrate were deposited by magnetron sputtering method. After annealed at 500degC, a hydrogen storage alloy was deposited on the back of the nickel substrate and the SrTi1-xNbxO3/Ni/hydrogen storage alloy (SNH) electrodes were fabricated. The influences of niobium dopant on the photoelectrochemical performance of SrTiO3 thin films and on the photo-chargeability of SNH electrodes were investigated. With the increase of the niobium content from 0.5 mol.% to 2 mol.% in the SrTiO3 films, the photocurrents, the open-circuit photovoltage of the SrTiO3 thin films and the photochargeability of the SNH electrode increased.
机译:通过磁控溅射法沉积厚度为约200nm的厚度为约200nm的SRTI <亚> 1-X / sub> Nb x O 3 膜。 在500℃退火后,沉积储氢合金,沉积在镍基材的背面和SRTI 1-X / sub> Nb x O 3 / 制造Ni /储氢合金(SENH)电极。 研究了铌掺杂剂对SRTIO 3 薄膜的光电化学性能以及SNH电极的光电可充电性的影响。 随着0.5摩尔的铌含量的增加。%至2摩尔%。在SRTIO 3 薄膜中,光电流,SRTIO 3 薄的开口电流光电图 薄膜和SNH电极的光焦度增加。

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