首页> 外文会议>Symposium on Neutron and X-Ray Scattering as Probes of Multiscale Phenomena >X-Ray Diffraction as a Probe for Elastic Strain: Micro- and Nanoscale Investigation of Thin Metal Films
【24h】

X-Ray Diffraction as a Probe for Elastic Strain: Micro- and Nanoscale Investigation of Thin Metal Films

机译:X射线衍射作为弹性应变的探针:薄金属膜的微型和纳米级调查

获取原文

摘要

In the past years the concept of measuring strain by x-rays has changed significantly. The combination of 3rd generation synchrotron sources, advanced focusing techniques and large area detectors has made it possible to probe volumes smaller than a cubic micron. This devolopment has made it possible to probe microstrains directly without having to rely on highly sophisticated models to evaluate peak broadening effects. This paper will provide a review of the state of art of local strain measurements by x-rays, discuss their limitations, provide an outlook of where the field may be going within the next years and address the most important issues to be solved. Examples will be given for the current limits in terms of resolution in time, space, strain and intensity.
机译:在过去几年中,X射线测量应变的概念显着变化。 第三代同步速度,高级聚焦技术和大面积检测器的组合使得可以探测小于立方米米的体积。 这种促进程序使得可以直接探测微威尔,而无需依赖高度复杂的模型来评估峰值扩展效果。 本文将对X射线进行X射线的局部应变测量艺术状态的审查,讨论其局限性,提供现场在未来几年内的位置,并解决最重要的问题。 将在时间,空间,应变和强度的分辨率方面给出电流限制。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号