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FUTURE DIRECTIONS OF NON-VOLATILE MEMORY TECHNOLOGIES

机译:未来的非易失性记忆技术方向

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It expected that for many years to come, the majority of the nonvolatile memories shipped will be based on current mainstream flash technologies, which utilize transistor based charge storage memory cells and multi-level-cell concepts, for storing more than one logic bit in a single physical cell. Moore's law will continue to drive transistor based memory technology scaling but technology complexity will be increasing. In order to meet technology scaling, the mainstream transistor based flash technologies will start evolving to incorporate material and structural innovations. This paper will review the current status and discuss the approaches being explored to provide scaling solutions for future transistor based non-volatile memory products. Based on the introduction of material innovations, it is expected that the planar transistor based flash memory cell can scale into the 32nm node. Further, more complex, structural innovations will be required to maintain further scaling. New memory concepts, not relying on transistors as a basis of the memory cell, provide new opportunities for future low cost memories. Several of these new concepts will be summarized and contrasted with the mainstream transistor based flash memory technologies.
机译:它预计未来几年,运输的大多数非易失性存储器将基于当前的主流闪存技术,利用基于晶体管的电荷存储器单元和多级单元概念,用于存储多个逻辑位单一物理细胞。摩尔定律将继续推动基于晶体管的内存技术缩放,但技术复杂性将增加。为了满足技术缩放,基于主流晶体管的闪光技术将开始不断发展,包括材料和结构创新。本文将审查现状,并讨论正在探索的方法为未来的基于晶体管的非易失性存储器产品提供缩放解决方案。基于材料创新的引入,预计基于平面晶体管的闪存单元可以扩展到32nm节点。此外,更复杂,结构创新将需要维持进一步扩大。新的记忆概念,而不是依赖晶体管作为存储器单元的基础,为未来的低成本记忆提供新的机会。这些新概念中的几个与基于主流晶体管的闪存技术概括并对比。

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