首页> 外文会议>Symposium on wide-Bandgap semiconductors for high power, high frequency and high temperature >Investigation of the V~(4+)-Center in 6H-SiC by the method of spectral-hole burning
【24h】

Investigation of the V~(4+)-Center in 6H-SiC by the method of spectral-hole burning

机译:通过光谱燃烧方法对6H-SIC的V〜(4 +)中心进行研究

获取原文

摘要

In the context of spectral-hole burning experiments in 4H- and 6H-SiC doped with vanadium the energy positions of the V~(4+/5+) level in both polytypes were determined in order to resolve discrepancies in literature. From these numbers the band offset of 6H-4H-SiC is calculated by using the Langer-Heinrich rule, and found to be of staggered type II. Furthermore the experiments show that thermally stable electronic traps exist in both polytypes at room temperature and considerably above, which may result in longtime transient shifts of electronic properties.
机译:在4H-和6H-SiC中的光谱空穴燃烧实验的背景下,测定两种聚型在两个聚型中的V〜(4 + / 5 +)水平的能量位置以解决文献中的差异。 从这些数字使用Langer-Heinrich规则计算6H-4H-SiC的带偏移,发现是交错的II型。 此外,实验表明,在室温下,热稳定的电子陷阱在室温下存在,并且高于上述,这可能导致电子性质的长时间瞬态偏移。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号