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Investigation of the V~(4+)-Center in 6H-SiC by the method of spectral-hole burning

机译:光谱孔燃烧法研究6H-SiC中V〜(4 +)-中心

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In the context of spectral-hole burning experiments in 4H- and 6H-SiC doped with vanadium the energy positions of the V~(4+/5+) level in both polytypes were determined in order to resolve discrepancies in literature. From these numbers the band offset of 6H-4H-SiC is calculated by using the Langer-Heinrich rule, and found to be of staggered type II. Furthermore the experiments show that thermally stable electronic traps exist in both polytypes at room temperature and considerably above, which may result in longtime transient shifts of electronic properties.
机译:在掺钒的4H-和6H-SiC光谱孔燃烧实验的背景下,确定了两种多型体中V〜(4 + / 5 +)能级的能量位置,以解决文献中的差异。根据这些数字,使用兰格-海因里希法则计算出6H-4H-SiC的能带偏移,发现其为交错型II。此外,实验表明,在室温和高于室温的两种多型体中均存在热稳定的电子陷阱,这可能导致电子特性的长期瞬态变化。

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