In this paper we present an on-chip noise detection circuit. Mainly, this work is different form the previous works concerning on-chip noise measurement in one or more of the following: First: it does not assume specific noise properties such as periodicity. Second: the requested bandwidth of the output channel can be adjusted freely, therefore, the user can avoid the effect of on-chip parasites and the need to off-chip sophisticated monitoring tools. Third: the detector is equipped with an on-chip voltage divider, which enables measuring the high swing fluctuations. Therefore, the detector is suitable to measure the non-periodic/single event noise for the purpose of reliability evaluation and performance modeling. The detector is implemented in a test chip using Hitachi 0.18??m technology.
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