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A comparative evaluation of new silicon carbide diodes and state-of-the-art silicon diodes for power electronic applications

机译:新型碳化硅二极管和最先进的电力电子应用硅二极管的比较评价

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摘要

Recent progress in Silicon Carbide (SiC) material has made it feasible to build power devices of reasonable current density. This paper will present recent results including a comparison with state-of-the-art silicon diodes. Switching losses fortwo silicon diodes (a fast diode, 600V, 50A, 6Ons Trr), an ultra-fast silicon diode (600v, 50A, 23ns Trr) and a 4H-SiC diode (600V, 50A) are compared. The effect of diode reverse recovery on the turn-on losses of a fast WARP IGBT are studied both at room temperature and at 150°C. At room temperature, SiC diodes allow a reduction of IGBT turn-on losses by 25% compared to ultra-fast silicon diodes and by 70% compared to fast silicon diodes. At 150°C junction temperature, SiC diodes allow a turn-on lossreduction of 35% and 85% compared to ultra-fast and fast silicon diodes respectively.The Silicon and SiC diodes are used in a boost converter with the WARP IGBT to assess the overall effect of SiC diodes on the converter characteristics. Efficiency measurements at light load (100W) and full load (500W) are reported. Although SiC diodesexhibit very low switching losses, their high conduction losses due to the high forward drop dominate the overall losses, hence reducing the overall efficiency. Since this is an ongoing development, it is expected that future prototypes will have improved forward characteristics.
机译:碳化硅(SiC)材料的最新进展使得构建合理电流密度的功率器件是可行的。本文将呈现最近的结果,包括与最先进的硅二极管的比较。切换损耗Fortwo硅二极管(快速二极管,600V,50A,6秒TRR),比较了超快速硅二极管(600V,50A,23NS TRR)和4H-SIC二极管(600V,50A)。在室温和150℃下,研究了二极管反向恢复对快速经纱IGBT的导通损耗的影响。与超快速硅二极管相比,在室温下,SiC二极管允许降低25%的IGBT导通损耗,并与快速硅二极管相比达到70%。与超快速和快速硅二极管相比,在150°C结温下,SiC二极管允许导通损失35%和85%。硅和SiC二极管用WARP IGBT用于评估SiC二极管对转换器特性的总体影响。报告了轻负载(100W)和满载(500W)的效率测量。虽然SiC Diodesex乏力的开关损耗非常低,但由于高前锋下降导致的高导电损耗主导了整体损失,因此降低了整体效率。由于这是一个持续的发展,预计未来的原型将有所改善的前瞻性特征。

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