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Influence of cooling conditions on the interfaciaS Cu6Sn5 intermetallic compound in Sn-37Pb/Cu solder joints during reflow

机译:回流焊时冷却条件对Sn-37Pb/Cu焊点中Cu6Sn5金属间化合物界面的影响

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Despite a shift to Pb-free solders in the majority of electronic assemblies, Pb-containing solders are still used in a variety of applications. Recent research has revealed the complexities of the intermetallic Cu6Sn5 in terms of its crystal structure and stability when present as the reaction product between Pb-free solders and common substrates. In light of these findings, the effect of multiple reflow cycles with different cooling conditions on the microstructure of the interfacial Cu6Sn5 intermetallic compound (IMC) between Sn-Pb solders and Cu substrates was reexamined. For this purpose, the Sn-37Pb (in wt.%) solder was reflowed on a Cu substrate at a temperature of around 240 °C and cooled at a rate of around 30 °C/min under each of two conditions; (i) direct-cooling to room temperature, and (ii) interrupted-cooling with extended isothermal holding periods of 30 and 180 seconds at 140 °C. This second condition was chosen to encourage the polymorphic transformation that occurs in the Cu6Sn5 (at an equilibrium temperature of 186 °C) at a temperature which minimises the stresses involved. Smaller cracks and a thinner interfacial IMC layer were observed in the solder joints that were reflowed repeatedly with the interrupted-cooling conditions. However, despite the higher number of cracks in the samples undergoing conventional reflow, the shear strength was not significantly affected.
机译:尽管大多数电子组件已转向无铅焊料,但含铅焊料仍在各种应用中使用。最近的研究揭示了金属间化合物Cu6Sn5作为无铅焊料和普通基板之间的反应产物时的晶体结构和稳定性的复杂性。根据这些发现,重新研究了不同冷却条件下的多次回流循环对锡铅焊料和铜基板之间界面Cu6Sn5金属间化合物(IMC)微观结构的影响。为此,Sn-37Pb(重量百分比)焊料在约240°C的温度下在铜基板上回流,并在两种条件下以约30°C/min的速率冷却;(i) 直接冷却至室温,以及(ii)在140°C下以30秒和180秒的延长等温保持期进行间断冷却。选择第二种条件是为了鼓励Cu6Sn5(在186°C的平衡温度下)在最小化所涉及应力的温度下发生多晶转变。在中断冷却条件下反复回流的焊点中观察到更小的裂纹和更薄的界面IMC层。然而,尽管经历常规回流焊的样品中存在较多的裂纹,但剪切强度并未受到显著影响。

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