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Influence of Holder Quality on Radiation Hardness of SI GaAs Detector

机译:保持器质量对Si GaAs检测器辐射硬度的影响

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Semi-insulating (SI) GaAs detectors irradiated by 5 MeV electrons to doses lower than 100 kGy exhibited different behaviour when considering their electrical and spectrometric properties. The detectors prepared by the same technology using one GaAs wafer might be divided into two groups according to the type of holder used to wire bond the detectors. The detectors applied to a ceramic holder did not exhibit any significant changes in their properties up to a maximum dose applied (83 kGy). The second group of GaAs detectors utilizing a PVC (PolyVinylChloride) holder underwent dramatic changes of both the electric and spectrometric properties and none of the detectors was able to work at a dose higher than 51 kGy. As the radiation hardness of GaAs detectors should approach 1 MGy according to recently published results, the obtained results imply an important influence of chosen type of holder. The study of bare detector holders irradiated by 5 MeV electrons under the same conditions as the investigated detectors proved their different radiation hardness. The ceramic holders exhibited just minimum changes up to a maximum applied dose of 139 kGy, while the current flowing through PVC holder under applied bias increased more than 10-times at a dose of 104 kGy and more than 100-times after 139 kGy applied.
机译:在考虑其电气和光谱性能时,将5meV电子照射为剂量的半绝缘(Si)GaAs探测器在10kGy的剂量下呈现不同的行为。通过使用一个GaAs晶片的相同技术制备的探测器可以根据用于引线焊接器的支架类型分成两组。施加到陶瓷架的探测器没有表现出其性质的任何显着变化,其最大施用(83kgy)。利用PVC(聚氯乙烯)保持器的第二组GaAs探测器接受了电力和光谱性能的显着变化,并且没有探测器能够以高于51 kgy的剂量工作。由于GaAs探测器的辐射硬度应根据最近公布的结果接近1 MGY,所获得的结果意味着所选择的支架类型的重要影响。在与所研究的探测器相同的条件下,在相同条件下在相同条件下进行裸检测器支架的研究证明了它们不同的辐射硬度。陶瓷支架的最小变化直至139 kgy的最大施加剂量,而在施加的偏差下流过PVC支架的电流在104 kgy的剂量下增加了10倍以上的10倍,并且在施加139 kgy后的100倍以上。

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