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Resistive switching memory devices using ZnO nanoparticles encapsulated in polyvinyl alcohol (PVA) matrix

机译:使用ZnO纳米粒子封装在聚乙烯醇(PVA)基质中的电阻切换存储器件

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In this work, metal/semiconductor nanocomposites/metal devices with aluminium (Al) as top electrode (TE) and bottom electrode (BE) were fabricated and investigated using ZnO nanoparticles (ZNPs) embedded in an insulating polyvinyl alcohol (PVA) matrix for non-volatile memory applications. The I-V measurements of Al/ZnO-PVA/Al device exhibited a non-volatile bistable resistive switching behaviour. The switching mechanism of the device was suggested by the models of trap controlled space-charge limited conduction (SCLC) and the charges trapping-detrapping process at the centers of ZNPs in the PVA matrix. The state of the device was maintained even after removal of the applied bias, indicating the non-volatile bistable memory. There was no remarkable degradation of the device in both the LRS and the HRS after 30 minutes continuous operation which demonstrated excellent stability of the device. The current ratio of high resistance state (HRS) to low resistance state (LRS) is about of the order of 10~2 at room temperature. This demonstration provides a class of memory devices for non-volatile bistable memory device applications.
机译:在这项工作中,金属/半导体纳米复合材料/金属与铝(Al)作为上电极(TE)和底部电极装置(BE)的制造,并使用嵌入在绝缘聚乙烯醇ZnO纳米颗粒(ZNPs)研究(PVA)矩阵非-volatile存储器应用。的Al / ZnO的PVA / Al的器件的I-V测量显示出的非易失性双稳态电阻切换行为。该设备的切换机构是由阱控制空间电荷有限传导的模型(SCLC)和电荷在PVA基质ZNPs的中心捕获-脱阱过程中提示。该装置的状态下即使在除去施加的偏压的保持之后,指示所述非易失性存储器双稳态。有在两个LRS和HRS的设备30分钟的连续运转,其证明了该设备的优异的稳定性后没有显着的降解。高电阻状态的(HRS)的电流比到低电阻状态(LRS)为约10〜2在室温下的数量级。该演示提供了一类用于非易失性存储器的双稳态器件应用存储装置。

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