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An improved reliable PSO based parameter extraction method applied to GaN HEMTs for mm-Wave applications

机译:一种改进的可靠性基于PSO的参数提取方法,适用于MM波应用的GaN HEMTS

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An improved and efficient parameter extraction method applied to GaN high electron mobility transistors (HEMTs) is presented. The aim is to extract reliable values for the generally distributed small-signal model to accurately describe the device at mm-wave range. A modified version of hybrid extraction technique combining particle-swarm-optimization and direct fitting has been implemented. S-parameters fitting has been used to validate the model under various bias conditions. The results indicate a very good agreement between model and simulation up to 60 GHz.
机译:提出了一种适用于GaN高电子迁移晶体管(HEMT)的改进和有效的参数提取方法。目的是提取通常分布的小信号模型的可靠值,以便在MM波范围内精确地描述该装置。已经实施了混合提取技术的改进版本,结合了粒子 - 群优化和直接配件。 S参数拟合已用于在各种偏置条件下验证模型。结果表明,模型和模拟之间的达成非常良好的一致性,高达60 GHz。

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