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USING CONDENSATION TESTING WITH SURFACE INSULATION RESISTANCE MEASUREMENTS FOR QFN RELIABILITY ASSESSMENT

机译:使用带表面绝缘电阻测量的冷凝测试进行QFN可靠性评估

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QFN packages are finding increased uses in higher reliability applications due to their smaller footprints, improved thermal and electrical performance (reference 1) and as such there is increased focus on their reliability performance in harsh environments (references 2 to 5). In order to investigate issues with condensation and surface insulation resistance (SIR), a range of test vehicles were assembled incorporating QFNs alongside other components, using two advanced production lines in Sweden. These produced boards with multiple no clean solder pastes using convection and vapour phase soldering. The aim of the project was to take surface insulation test boards based on the IPC B52 test pattern and assess the impact of conventional SIR testing of QFNs alongside a newly developed condensation test. This condensation test has been driven by an increased requirement to understand the performance of electronic assemblies in humid environments. Whenever there is a significant level of ambient humidity, if parts of the assembly drop beneath the dew point, there is the opportunity for the formation of condensed water on the surface of components and substrate. This can significantly reduce the insulation resistance of the substrate surface, resulting in malfunctioning electronics. Reproducing repeatable levels of condensation during testing can be challenging. Most humidity chambers are designed to achieve stable, well controlled humidity and temperature conditions, but none of these offer condensing options. Therefore the user has to improvise. Existing common approaches include ramping at a fast enough rate to cause condensation, or running chambers very close to 100% relative humidity. A drawback of these approaches is that chambers of different designs will perform differently, and will be sensitive to small drops in cooling performance. At NPL, a new approach has been developed where the test board is mounted on a platen whose temperature can be independently controlled without changing the ambient condition in the humidity chamber. Thus, the temperature of the test board can be depressed below ambient to any desired point and hence, produce condensation at different levels. It is therefore straightforward to cycle between condensing and non-condensing conditions on the test board in a constant ambient environment. The technique has been demonstrated to be repeatable and controllable, with the user able to select a temperature differential that matches their worst in-use conditions, or to understand the performance of their system under a range of condensing conditions. Modification to the test board in this project, allowed the group to test the impact of residues under the QFN/LGA packages with the introduction of SIR test pattern under four packages per board. There have been lots of debate on the reliability of cleanliness under these packages and the possibility of surface corrosion. This work investigates the current uncertainty. This paper will outline the processes and parameters used for the production which featured surface mount reflow and through-hole selective soldering with no clean fluxes. The results from the same boards with different paste products will be compared with testing under traditional exposure to elevated temperature and relatively humidity plus the controlled introduction of moisture to the test board.
机译:由于其较小的占地面积,改善的热电平和电气性能(参考文献1),QFN包在更高可靠性应用中寻找更高的可靠性应用中的用途,因此在恶劣环境中增加了它们的可靠性性能(参考2至5)。为了调查凝结和表面绝缘电阻(SIR)的问题,使用瑞典的两个先进的生产线组装了一系列测试车辆与其他部件一起结合QFN。这些生产的板具有多个无清洁焊膏使用对流和气相焊接。该项目的目的是根据IPC B52测试模式采用表面绝缘测试板,并评估QFN的传统SIR测试的影响以及新开发的冷凝试验。这种冷凝试验是通过增加的要求,了解在潮湿环境中的电子组件的性能的需求增加。每当有显着水平的环境湿度,如果组装的部分放在露点下方,则有机会在组分和基材表面形成冷凝水。这可以显着降低基板表面的绝缘电阻,导致电子器件发生故障。在测试期间再现可重复的凝结水平可能是具有挑战性的。大多数湿度房间设计用于实现稳定,良好控制的湿度和温度条件,但这些都不是提供冷凝选项。因此,用户必须即兴创作。现有的常见方法包括以足够快的速率斜坡以引起冷凝,或者非常接近100%相对湿度的运行室。这些方法的缺点是不同设计的腔室将不同地执行,并且对冷却性能的小滴加敏感。在NPL,已经开发了一种新的方法,其中测试板安装在压板上,该压板,其温度可以独立地控制而不改变湿度室中的环境条件。因此,可以将测试板的温度低于环境温度,以任何所需的点,并且因此产生不同水平的凝结。因此,它在恒定的环境环境中的测试板上的冷凝和非冷凝条件之间循环直接。该技术已经证明是可重复和可控的,并且用户能够选择与其最差的内使用条件匹配的温差,或者在冷凝条件下理解其系统的性能。修改到该项目中的测试板,允许该组在QFN / LGA封装下试验残留物的影响,并在每个董事会的四个包装下引入SIR测试模式。关于这些包装下的清洁度的可靠性以及表面腐蚀的可能性存在很多争论。这项工作调查了当前的不确定性。本文将概述用于生产的过程和参数,该方法和参数采用表面贴装回流和无孔选择性焊接,没有干净的助焊剂。与传统暴露于升高的温度和相对湿度的测试,将与不同糊剂产品的同一板的结果与升高的湿度加上测试板的控制引入水分。

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