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Annealing dependence on flexible p-CuGaO_2/n-ZnO heterojunction diode deposited by RF sputtering method

机译:RF溅射法沉积柔性P-CugaO_2 / N-ZnO异质结二极管的退火依赖性

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In this work, p-CuGaO_2/n-ZnO heterojunction diodes were deposited by RF powered sputtering method on polyethylene terephthalate (PETP, PET) substrates. Structural, morphology, optical and electrical properties of CuGaO_2/ZnO heterojunction was investigated as a function of annealing duration. The structural properties show the ZnO films (002) peak were stronger at the range of 34° while CuGaO_2 (015) peak is not visible at 44°C. The surface morphology revealed that RMS roughness become smoother as the annealing duration increase to 30 minutes and become rougher as the annealing duration is increased to 60 minutes. The optical properties of CuGaO_2/ZnO heterojunction diode at 30 minutes exhibit approximately 75% optical transmittance in the invisible region. The diodes exhibited a rectifying characteristic and the maximum forward current was observed for the diode annealed for 30 minutes. The diodes show an ideality factor range from 43.69 to 71.29 and turn on voltage between 0.75 V and 1.05 V.
机译:在这项工作中,通过RF动力溅射法在聚对苯二甲酸乙二醇酯(PETP,PET)基板上沉积P-CugaO_2 / N-ZnO异质结二极管。研究了CugaO_2 / ZnO异质结的结构,形态,光学和电性能作为退火持续时间的函数。结构性质显示ZnO膜(002)峰在34°的范围内较强,而CugaO_2(015)峰在44℃下不可见。表面形态显示,随着退火持续时间增加至30分钟,RMS粗糙度变得更加顺畅,随着退火持续时间变得更加粗糙到60分钟。 30分钟的CugaO_2 / ZnO异质结二极管的光学性质在看不见区域中表现出约75%的光学透射率。二极管表现出整流特性,并且观察到最大正向电流为二极管退火30分钟。二极管显示出于43.69至71.29的理想因子范围,并在0.75 V和1.05 V之间接通电压。

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