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Design of universal test instrument based on FPGA reconfigurable technology

机译:基于FPGA可重构技术的通用测试仪设计

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Based on FPGA reconfigurable technology, this research analyzes and compares several ways of realizing FPGA reconfiguration and proposes a plan of reconfigurable design based on SOPC. In this plan, the structure of "FPGA + Flash + SD Card" is adopted, and the universal test instrument is designed to incorporate multiple functions such as signal excitation, signal acquisition, data communications, and fault diagnosis and so on. It has many advantages of miniaturization, universalization, being reconfigurable, being easy to upgrade and supporting the parallel test.
机译:基于FPGA可重构技术,该研究分析并比较了实现FPGA重新配置的几种方法,并提出了基于SOPC的可重构设计计划。在该计划中,采用“FPGA +闪光+ SD卡”的结构,通用测试仪器旨在包含多种功能,如信号激励,信号采集,数据通信和故障诊断等。它具有许多小型化,普及,可重新配置,易于升级和支持并行测试。

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