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Optimization of probe capability using MPCps

机译:使用MPCPS优化探测能力

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摘要

Based on the MPCpS, it has been concluded that Probe Damage Occurrence at Prober X using blade type needle are caused by Capability Limitation. Set-up constraint is the reason for Capability issue. Optimum Setting determined from Stage 4 has been immediately implemented. There is a Characterization made separately for checking of consequential effect since the contact during Probing is being decreased approximately 1 mil. Implementation of the change in over travel setting resulted to significant decrease in terms of Probe Damage ppm.
机译:基于MPCPS,已经得出结论,使用刀片型针探测探针损伤是由能力限制引起的。设置约束是能力问题的原因。立即实施了从阶段4确定的最佳设置。由于探测期间的接触减小,分别用于检查后果效果的表征,以便在探测期间的触点减小。在旅行环境中的实施方式的实施导致探针损伤PPM的显着降低。

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