Detection of defects on apple using B-spline lighting correction method

摘要

To effectively extract defective areas in fruits, the uneven intensity distribution that was produced by the lighting system or by part of the vision system in the image must be corrected. A methodology was used to convert non-uniform intensity distribution on spherical objects into a uniform intensity distribution. A basically plane image with the defective area having a lower gray level than this plane was obtained by using proposed algorithms. Then, the defective areas can be easily extracted by a global threshold value. The experimental results with a 94.0% classification rate based on 100 apple images showed that the proposed algorithm was simple and effective. This proposed method can be applied to other spherical fruits.