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Pixel defect detection and correction device, imaging apparatus, pixel defect detection and correction method, and program

机译:像素缺陷检测和校正装置,成像设备,像素缺陷检测和校正方法以及程序

摘要

A pixel defect detection and correction device includes: an average value acquisition section that acquires an average value of pixel values of adjacent pixels with different colors excluding a pixel whose defect is to be detected, which is a pixel of interest, in a processing region where adjacent pixels with the same color and adjacent pixels with different colors are arrayed with the pixel whose defect is to be detected in the middle; and a defect determining section that determines whether the pixel whose defect is to be detected is defective on the basis of at least the average value. The defect determining section determines whether the pixel whose defect is to be detected is defective by comparison of the pixel value of the pixel whose defect is to be detected, the average value of adjacent pixels with different colors, and a designated different-color pixel threshold value.
机译:像素缺陷检测和校正装置包括:平均值获取部分,在处理区域中,该平均值获取部分获取除了要检测缺陷的像素以外的具有不同颜色的相邻像素的像素值的平均值,该像素是关注像素。将要检测缺陷的像素排列在具有相同颜色的相邻像素和具有不同颜色的相邻像素中;缺陷确定部分至少根据所述平均值来确定要检测其缺陷的像素是否存在缺陷。缺陷确定部分通过将要检测缺陷的像素的像素值,具有不同颜色的相邻像素的平均值和指定的不同颜色像素阈值进行比较,来确定要检测缺陷的像素是否是缺陷。值。

著录项

  • 公开/公告号US8508631B2

    专利类型

  • 公开/公告日2013-08-13

    原文格式PDF

  • 申请/专利权人 JUN HASHIZUME;

    申请/专利号US20100923917

  • 发明设计人 JUN HASHIZUME;

    申请日2010-10-14

  • 分类号H04N9/64;

  • 国家 US

  • 入库时间 2022-08-21 16:48:16

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