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Growth of GaAsP by Solid Source Molecular Beam Epitaxy

机译:通过固体源分子束外延的GaAsp的生长

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The GaAsP crystal material grown on GaAs substrate has been extensive applications in the area of photoelectronic device. There because GaAsP have advantageous photoelectronic performance and adjustable band gap. We report growth of GaAs_(1-x)P_x grown on GaAs substrate by solid source molecular beam epitaxy (SSMBE). On the basis of the optimized V/III flux ratio, appropriate growth rate, and the substrate temperature for sample growth, different composition GaAs_(1-x)P_x layers had been grown on GaAs top. Lattice-mismatched became the big challenges to high-quality epitaxial growth of the GaAs_(1-x)P_x materials on GaAs substrate. The crystalline quality, surface morphology were performed by applying high resolution X-ray diffractometry (HRXRD) and high resolution optical microscopy. The etched region and internal defect were also investigated.
机译:在GaAs衬底上生长的GaASP晶体材料在光电装置的区域中已经广泛应用。因为GaASP具有有利的光电性能和可调节带隙。我们通过固体源分子束外延(SSMBE)报告在GaAs底物上生长的GaAs_(1-x)P_x的生长。基于优化的V / III焊剂比,适当的生长速率和样品生长的衬底温度,在GaAs顶部生长了不同的组成GaAs_(1-x)P_x层。格子错配成为GaAs衬底上GaAs_(1-x)P_x材料的高质量外延生长的巨大挑战。通过施加高分辨率X射线衍射测定(HRXRD)和高分辨率光学显微镜进行结晶质量,表面形貌。还研究了蚀刻区域和内部缺陷。

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