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Design of peak detector and sub-flash architecture for adaptive resolution of flash ADC

机译:用于闪光ADC自适应分辨率的峰值检测器和亚闪光架构的设计

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Here we have proposed a design of Peak Detector and Sub-Flash architecture for adaptive Resolution ADC in 90nm Technology. The control circuits are developed for Adaptive Resolution for Flash ADC. Peak detector circuits will consist of peak detector for variable resolution and sub-flash architecture for reconfigurability. The voltages from the Bias block are used to provide a control voltage for Peak Detector circuits. The Transient analysis for peak detector circuits are tested for pulse and sinusoidal input voltage and the settling time is reported to be 5ns and 10ns. For reconfigurability, the input voltage vin is compared with Bias Block voltages for achieving the resolution i.e, 4-, 5-, 6-bit respectively. Sub flash block consist of comparators, Mux and Decoder circuit. Rail to rail comparators are used for decision making of resolution selectivity. Process corner analysis is carried out for comparators to check process variation dependency of analog circuit. This reconfigurable architecture is clubbed with Threshold Inverter quantized (TIQ) ADC to get 4-, 5-, and 6-bit resolution depending upon input applied which provides large amount of power saving.
机译:在这里,我们提出了90nm技术中的自适应分辨率ADC的峰值检测器和亚闪光架构的设计。为闪光ADC的自适应分辨率开发了控制电路。峰值检测器电路将由峰值检测器组成可变分辨率和用于可重新配置性的亚闪光架构。来自偏置块的电压用于为峰值检测器电路提供控制电压。峰值检测器电路的瞬态分析用于脉冲和正弦输入电压,并报告沉降时间为5ns和10ns。为了重新配置性,将输入电压Vin与偏置块电压进行比较,用于分别实现分辨率i.e,4-,5-,6位。子闪存块包括比较器,MUX和解码器电路。导轨到轨道比较器用于决策选择性的决策。对比较器进行了处理拐角分析,以检查模拟电路的过程变化依赖性。这种可重新配置的架构是具有阈值逆变器量化(TIQ)ADC的俱乐部,以获得4-,5-和6位分辨率,具体取决于所应用的输入,该输入提供了大量的省电。

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