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Effect of Specimen Preparation Method on Transmission Electron Microscope Investigation in a Bulk Metallic Glass

机译:样品制备方法对散装金属玻璃透射电子显微镜调查的影响

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In this paper, high resolution transmission electron microscopy (HRTEM) has been used to observe a Zr_(41.25)Ti1_(3.75)Ni10Cu1_(2.5)Be_(22.5) (at. %) bulk metallic glass (BMG) prepared from different methods, i.e. ion milling and electropolishing. The ion thinning brings out the white bulb pattern on the specimen surface and induces localized temperature increasing. The electropolishing does not influence microstructure of the amorphous phase. A new preparation technique of grinding method is introduced. For BMG, the electropolishing and grinding are the better method for TEM specimen preparation as compared with the ion thinning.
机译:在本文中,高分辨率透射电子显微镜(HRTEM)已被用于观察由不同方法制备的Zr_(41.25)Ti1_(3.75)Ni10Cu1_(2.5)Be_(22.5)(22.5)块状金属玻璃(BMG),即离子铣削和电抛光。离子稀动在样品表面上带出了白色灯泡图案,并诱导局部温度升高。电抛光不影响非晶相的微观结构。介绍了一种新的研磨方法的制备技术。对于BMG,电抛光和研磨是与离子稀化相比的TEM样品制备方法更好的方法。

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