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Optimal Design of Double Stresses Accelerated Life Test With Competing Risks

机译:双重应力的最佳设计加速了竞争风险的生命试验

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In order to shorten test time and realize rapid evaluation of the reliability of high reliability and long lifetime competing risk products, based on the rules of optimum design plan of double stresses accelerate life test, this paper presents a method of simulation based on optimal designs for double stresses accelerated life test with competing risks (CRDS-ALT) and presents a procedure of the test with Monte-Carlo, the asymptotic variance estimation of 100pth percentile of the lifetime distribution of the product at use condition were considered as goal function. Through defining each test stress level and the test censoring numbers of corresponding stress as the design variables, we makes statistics of analysis with MLE theory, and establishes the optimal designed model of double stresses accelerated life test with competing risks based on simulation. Based on the interpolation fitting theory, the target function is presented, which reduces the emulation scale, improves the efficiency of the test, and provides a technical support for optimal design for AT in life prediction of electronic equipment.
机译:为了缩短测试时间并实现高可靠性可靠性和长寿命竞争风险产品的快速评估,基于双重应力的最佳设计计划的规则加速寿命测试,本文提出了一种基于最优设计的模拟方法双重应力加速竞争风险(CRDS-ALT)的寿命试验,并呈现与Monte-Carlo的测试程序,100pth百分位数在使用条件下产品的寿命分布的渐近方差估计被认为是目标功能。通过定义每个测试应力水平和对应应力的测试次数作为设计变量,我们用MLE理论进行分析统计,并建立了基于模拟的竞争风险的双重压力的最佳设计模型。基于插值拟合理论,提出了目标功能,这降低了仿真规模,提高了测试的效率,并为电子设备的生活预测提供了用于最佳设计的技术支持。

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