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Optimal design of double stresses accelerated life test with competing risks

机译:具有双重压力的优化设计可加速寿命测试并具有竞争风险

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In order to shorten test time and realize rapid evaluation of the reliability of high reliability and long lifetime competing risk products, based on the rules of optimum design plan of double stresses accelerate life test, this paper presents a method of simulation based on optimal designs for double stresses accelerated life test with competing risks (CRDS-ALT) and presents a procedure of the test with Monte-Carlo, the asymptotic variance estimation of 100pth percentile of the lifetime distribution of the product at use condition were considered as goal function. Through defining each test stress level and the test censoring numbers of corresponding stress as the design variables, we makes statistics of analysis with MLE theory, and establishes the optimal designed model of double stresses accelerated life test with competing risks based on simulation. Based on the interpolation fitting theory, the target function is presented, which reduces the emulation scale, improves the efficiency of the test, and provides a technical support for optimal design for AT in life prediction of electronic equipment.
机译:为了缩短测试时间并实现对高可靠性和长寿命竞争风险产品的可靠性的快速评估,基于双应力加速寿命试验的最佳设计方案,提出了一种基于最优设计的仿真方法。双重应力加速了具有竞争风险的寿命测试(CRDS-ALT),并提出了采用蒙特卡洛的测试程序,在使用条件下,产品寿命分布的100%百分位数的渐近方差估计被视为目标函数。通过定义每个测试应力水平和相应应力的测试检查次数作为设计变量,利用MLE理论进行统计分析,并建立基于仿真的具有竞争风险的双应力加速寿命试验的最优设计模型。基于插值拟合理论,提出了目标函数,减小了仿真规模,提高了测试效率,为电子设备寿命预测中的AT优化设计提供了技术支持。

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