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Plasma density decay of vacuum discharges after current zero

机译:电流零后真空放电等离子体密度衰减

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The knowledge of the physical processes around current zero and their modeling is important for the development of vacuum interrupters towards higher switching capacity and higher voltages. One essential feature is the recovery of the arc gap after current zero from the well-conducting state of the high-current plasma to the isolating state of the cold gap. Like in other switching media, there is still plasma present in the switching gap at current zero, which needs time to recombine and disappear. The presence of post-arc charge is associated with post-arc current under the influence of the transient recovery voltage, which in turn interacts with the surrounding network. As the charges carried by the post-arc current leave the gap, the post-arc current also influences the plasma decay. A simulation of this combined behavior needs an adequate mathematical post-arc model as well as the knowledge of data of the charge-carrier densities and their decay. It is the aim of this work to determine the necessary data, based on a simplified one-dimensional post-arc model, and to compare model calculations with experiments
机译:电流零周围的物理过程及其建模的知识对于对更高的开关容量和更高电压的较高的真空中断器的开发是重要的。一个基本特征是从高电流等离子体的井导通孔到冷隙的隔离状态回收电流零的电弧间隙的恢复。与其他开关介质一样,在电流零时的开关间隙中存在静止等离子体,需要时间重新组合并消失。后电弧充电的存在与瞬态恢复电压的影响下的电弧电流相关联,这反过来与周围网络相互作用。随着电弧电流携带的电荷留下间隙,电弧电流也影响等离子体衰减。这种组合行为的模拟需要足够的数学邮政邮政模型以及充电载波密度的数据和衰减的知识。这项工作的目的是基于简化的一维后电弧模型来确定必要的数据,并使用实验比较模型计算

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